共 8 条
- [1] AKAMINE S, 1995, IEEE P MEMS 95, P145
- [2] BREAKING THE DIFFRACTION BARRIER - OPTICAL MICROSCOPY ON A NANOMETRIC SCALE [J]. SCIENCE, 1991, 251 (5000) : 1468 - 1470
- [4] SCANNING NEAR-FIELD OPTICAL MICROSCOPY [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1994, 59 (02): : 89 - 101
- [5] OPTICAL NEAR-FIELD IMAGING WITH A SEMICONDUCTOR PROBE TIP [J]. APPLIED PHYSICS LETTERS, 1994, 64 (18) : 2338 - 2340
- [6] Pohl D.W., 1991, ADV OPT ELECTRON MIC, V12, P243, DOI [10.1016/B978-0-12-029912-6.50009-9, DOI 10.1016/B978-0-12-029912-6.50009-9]