THE CHARACTERIZATION OF THE SURFACES OF TUNGSTEN-BASED DISPENSER CATHODES

[1] CHARACTERIZATION OF TUNGSTEN IMPREGNATED DISPENSER CATHODES USING ISS AND SIMS [J]. APPLIED SURFACE SCIENCE, 1980, 4 (3-4) : 374 - 384

[2] BENNINGHOVEN A, 1979, SPRINGER SERIES CHEM, V9, P116

[3] DAVIS LE, 1976, HDB AUGER ELECTRON S

[4] ATOMIC AND MOLECULAR EJECTION FROM ION-BOMBARDED REACTED SINGLE-CRYSTAL SURFACES - OXYGEN ON COPPER-(100) [J]. PHYSICAL REVIEW B, 1978, 18 (11): : 6000 - 6010

[5] OSMIUM-TUNGSTEN ALLOYS AND THEIR RELEVANCE TO IMPROVED M-TYPE CATHODES [J]. APPLIED SURFACE SCIENCE, 1981, 8 (1-2) : 13 - 35

[6] INTERATOMIC AUGER ANALYSIS OF THE OXIDATION OF THIN BA FILMS .2. APPLICATIONS TO IMPREGNATED CATHODES [J]. APPLIED SURFACE SCIENCE, 1983, 16 (1-2) : 139 - 162

[7] INTERATOMIC AUGER ANALYSIS OF THE OXIDATION OF THIN BA FILMS .1. CHARACTERIZATION OF THE LOW-ENERGY AUGER SPECTRUM [J]. APPLIED SURFACE SCIENCE, 1983, 16 (1-2) : 125 - 138

[8] HAAS GA, 1979, SURFACE SCI, V2, P173

[9] APPLICATION OF LOW DAMAGE SIMS AES XPS OF THE BA-O-W SYSTEM TO CATHODE CHARACTERIZATION [J]. APPLIED SURFACE SCIENCE, 1983, 16 (1-2) : 207 - 219

[10] FAST TURN-ON CHARACTERISTICS OF TUNGSTEN-BASED DISPENSER CATHODES FOLLOWING GAS EXPOSURES [J]. APPLIED SURFACE SCIENCE, 1983, 16 (1-2) : 73 - 92

[1] CHARACTERIZATION OF TUNGSTEN IMPREGNATED DISPENSER CATHODES USING ISS AND SIMS [J]. APPLIED SURFACE SCIENCE, 1980, 4 (3-4) : 374 - 384

[2] BENNINGHOVEN A, 1979, SPRINGER SERIES CHEM, V9, P116

[3] DAVIS LE, 1976, HDB AUGER ELECTRON S

[4] ATOMIC AND MOLECULAR EJECTION FROM ION-BOMBARDED REACTED SINGLE-CRYSTAL SURFACES - OXYGEN ON COPPER-(100) [J]. PHYSICAL REVIEW B, 1978, 18 (11): : 6000 - 6010

[5] OSMIUM-TUNGSTEN ALLOYS AND THEIR RELEVANCE TO IMPROVED M-TYPE CATHODES [J]. APPLIED SURFACE SCIENCE, 1981, 8 (1-2) : 13 - 35

[6] INTERATOMIC AUGER ANALYSIS OF THE OXIDATION OF THIN BA FILMS .2. APPLICATIONS TO IMPREGNATED CATHODES [J]. APPLIED SURFACE SCIENCE, 1983, 16 (1-2) : 139 - 162

[7] INTERATOMIC AUGER ANALYSIS OF THE OXIDATION OF THIN BA FILMS .1. CHARACTERIZATION OF THE LOW-ENERGY AUGER SPECTRUM [J]. APPLIED SURFACE SCIENCE, 1983, 16 (1-2) : 125 - 138

[8] HAAS GA, 1979, SURFACE SCI, V2, P173

[9] APPLICATION OF LOW DAMAGE SIMS AES XPS OF THE BA-O-W SYSTEM TO CATHODE CHARACTERIZATION [J]. APPLIED SURFACE SCIENCE, 1983, 16 (1-2) : 207 - 219

[10] FAST TURN-ON CHARACTERISTICS OF TUNGSTEN-BASED DISPENSER CATHODES FOLLOWING GAS EXPOSURES [J]. APPLIED SURFACE SCIENCE, 1983, 16 (1-2) : 73 - 92