CONTRAST IN THE ELECTRON SPECTROSCOPIC IMAGING MODE OF A TEM .1. INFLUENCE OF ZERO-LOSS FILTERING ON SCATTERING CONTRAST

被引:35
作者
REIMER, L
ROSSMESSEMER, M
机构
来源
JOURNAL OF MICROSCOPY-OXFORD | 1989年 / 155卷
关键词
D O I
10.1111/j.1365-2818.1989.tb02880.x
中图分类号
TH742 [显微镜];
学科分类号
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页码:169 / 182
页数:14
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共 34 条
  • [1] MEAN FREE PATH OF RELATIVISTIC ELECTRONS FOR PLASMON EXCITATION
    ASHLEY, JC
    RITCHIE, RH
    [J]. PHYSICA STATUS SOLIDI, 1970, 40 (02): : 623 - &
  • [2] INFLUENCE OF A SCATTERING PHASE PLATE ON AN ELECTRON-MICROSCOPIC PICTURE
    BADDE, HG
    REIMER, L
    [J]. ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1970, A 25 (05): : 760 - &
  • [3] BAUER R, 1987, OPTIK, V77, P171
  • [4] COLLIEX C, 1984, QUANTITATIVE ELECTRO, P149
  • [5] MEASUREMENT OF INELASTIC-ELASTIC SCATTERING RATIO FOR FAST ELECTRONS AND ITS USE IN STUDY OF RADIATION-DAMAGE
    EGERTON, RF
    [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1976, 37 (02): : 663 - 668
  • [6] ELECTRON-SCATTERING IN ICE AND ORGANIC MATERIALS
    EUSEMANN, R
    ROSE, H
    DUBOCHET, J
    [J]. JOURNAL OF MICROSCOPY-OXFORD, 1982, 128 (DEC): : 239 - 249
  • [7] MEASUREMENT OF TOP BOTTOM EFFECT IN SCANNING-TRANSMISSION ELECTRON-MICROSCOPY OF THICK AMORPHOUS SPECIMENS
    GENTSCH, P
    GILDE, H
    REIMER, L
    [J]. JOURNAL OF MICROSCOPY-OXFORD, 1974, 100 (JAN): : 81 - 92
  • [8] INOKUTI M, 1979, ULTRAMICROSCOPY, V3, P423
  • [9] Isaacson M.S., 1977, PRINCIPLES TECHNIQUE, V7, P1
  • [10] KIHN Y, 1976, J MICROSC SPECT ELEC, V1, P363