ATOMIC-BEAM SPECTROMETER FOR SURFACE INVESTIGATIONS

被引：3

作者：

SCHERB, P ^{[1
]}

HORL, EM ^{[1
]}

机构：

[1] OSTERREICH STUDIEN GESELL ATOM ENERGIE GES MBH,FORSCH ZENTRUM,INSTMET,SEIBERSDORF,AUSTRIA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1976年 / 47卷 / 12期

关键词：

D O I：

10.1063/1.1134565

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1511 / 1515

页数：5

共 14 条

[1]

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[2]

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[3] REFLECTION, DIFFRACTION AND SELECTIVE ADSORPTION OF ATOMIC-HYDROGEN ON (001) SURFACE OF LIF [J].

HOINKES, H ;

WILSCH, H ;

NAHR, H .

SURFACE SCIENCE, 1972, 30 (02) :363-&

[4] REFLECTION OF HE-4 ATOMIC BEAMS FROM CLEAN LIF SURFACES [J].

HOUSTON, DE ;

FRANKL, DR .

PHYSICAL REVIEW LETTERS, 1973, 31 (05) :298-300

[5] MOLECULAR-BEAM SOURCES FABRICATED FROM MULTICHANNEL ARRAYS .I. ANGULAR DISTRIBUTIONS AND PEAKING FACTORS [J].

JONES, RH ;

OLANDER, DR ;

KRUGER, VR .

JOURNAL OF APPLIED PHYSICS, 1969, 40 (11) :4641-&

[6]

MARTON L, 1967, METHODS EXPT PHYSI A, V4, P155

[7]

MARTON L, 1968, METHODS EXPT PHYSI A, V7, P256

[8]

SALTSBURG H, 1967, ADVAN APPL MECH S4, V1, P223

[9]

SCHERB P, 1971, THESIS TU VIENNA

[10]

SCHERB P, 1974, THESIS TU VIENNA

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