ELECTRON-BEAM INDUCED INSTABILITY DURING FILAMENTARY CURRENT TRANSPORT IN N-GAAS

被引：16

作者：

RAU, U ^{[1
]}

AOKI, K ^{[1
]}

PEINKE, J ^{[1
]}

PARISI, J ^{[1
]}

CLAUSS, W ^{[1
]}

HUEBENER, RP ^{[1
]}

机构：

[1] KOBE UNIV, FAC ENGN, DEPT ELECT ENGN, NADA KU, KOBE 657, JAPAN

来源：

ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER | 1990年 / 81卷 / 01期

关键词：

D O I：

10.1007/BF01454212

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

We report experimental investigations on the current transport of n-GaAs under the conditions of impact ionization avalanche breakdown at low temperatures. The spontaneous formation of a single current filament was observed by means of low-temperature scanning electron microscopy. An electron-beam induced instability occurs at the onset of filamentation. We demonstrate this instability to be due to the local disturbance at the boundaries of the current filament. Our results are compared to the similar behavior of n-GaAs under IR irradiation (firing wave instability). © 1990 Springer-Verlag.

引用

页码：53 / 58

页数：6

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