SIMPLIFIED TALBOT INTERFEROMETERS FOR LENS TESTING

被引：6

作者：

BENTON, SA ^{[1
]}

MERRILL, DP ^{[1
]}

机构：

[1] POLAROID CORP, RES LAB, CAMBRIDGE, MA 02139 USA

来源：

OPTICAL ENGINEERING | 1976年 / 15卷 / 04期

关键词：

D O I：

10.1117/12.7971985

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：328 / 331

页数：4

共 15 条

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