A MULTIMODE HIGH-ANGULAR-RESOLUTION POWDER DIFFRACTOMETER

被引：2

作者：

KURAHASHI, M ^{[1
]}

HONDA, K ^{[1
]}

GOTO, M ^{[1
]}

INARI, Y ^{[1
]}

KATAYAMA, C ^{[1
]}

机构：

[1] MAC SCI LTD,HACHIOJI,TOKYO 192,JAPAN

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1991年 / 24卷

关键词：

D O I：

10.1107/S0021889890008780

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A new powder diffractometer has been designed which can be used for various experimental geometries such as the long-arm Bragg-Brentano method, Guinier method and parallel-beam method. The X-ray source, goniometer and scintillation counter are placed on rails so that the source-to-monochromator, monochromator-to-sample and sample-to-counter distances can be changed arbitrarily. A FWHM of 0.07-degrees for the K-alpha-1 peak of the silicon 111 reflection was obtained by lengthening the counter arm in the Bragg-Brentano method. Rather high angular resolution was achieved by the Guinier and parallel-beam methods for organic samples having poor crystallinity and low absorption.

引用

页码：61 / 63

页数：3