LASER AS LIGHT SOURCE FOR OPTICAL DIFFRACTOMETERS - FOURIER ANALYSIS OF ELECTRON MICROGRAPHS

被引:9
作者
BERGER, JE
ZOBEL, CR
ENGLER, PE
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D O I
10.1126/science.153.3732.168
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
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页码:168 / &
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