MEASUREMENT OF TARGET SCATTERING MATRIX

被引：112

作者：

HUYNEN, JR

机构：

来源：

PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS | 1965年 / 53卷 / 08期

关键词：

D O I：

10.1109/PROC.1965.4072

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：936 / &

共 75 条

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[J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1965, 53 (08): : 1089 - &
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