LOW-ENERGY ELECTRON AND POSITRON DIFFRACTION MEASUREMENTS AND ANALYSIS ON CU(100)

被引：54

作者：

MAYER, R

ZHANG, CS

LYNN, KG

FRIEZE, WE

JONA, F

MARCUS, PM

机构：

[1] SUNY STONY BROOK,COLL ENGN & APPL SCI,STONY BROOK,NY 11794

[2] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

PHYSICAL REVIEW B | 1987年 / 35卷 / 07期

关键词：

D O I：

10.1103/PhysRevB.35.3102

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：3102 / 3110

页数：9

共 34 条

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