共 6 条
- [2] MEASUREMENT OF CALIBRATED CURRENT-VOLTAGE CHARACTERISTICS UP TO SECOND DERIVATIVE [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (08): : 770 - 774
- [3] MICROCOMPUTER CONTROL OF THIN-FILM DEPOSITION RATE [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1983, 16 (06): : 544 - 548
- [4] INELASTIC ELECTRON-TUNNELING [J]. PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 1977, 30 (02): : 145 - 206
- [5] HEBARD AF, 1973, REV SCI INSTRUM, V45, P529
- [6] HOROWITZ P, 1980, ART ELECTRONICS