GLANCING ANGLE MEASUREMENTS OF OXYGEN DEPTH PROFILES

被引：2

作者：

BIRD, JR ^{[1
]}

DUERDEN, P ^{[1
]}

CLAPP, RA ^{[1
]}

机构：

[1] NEW S WALES INST TECHNOL,SCH PHYS & MAT,BROADWAY,NSW 2007,AUSTRALIA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1981年 / 191卷 / 1-3期

关键词：

D O I：

10.1016/0029-554X(81)91027-2

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：345 / 348

页数：4

共 7 条

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[7] APPLICATION OF HIGH-RESOLUTION RUTHERFORD BACKSCATTERING TECHNIQUES TO NEAR-SURFACE ANALYSIS [J].

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