PRELIMINARY STUDY OF PURE METAL-SURFACES USING AUGER-ELECTRON SPECTROSCOPY (AES), X-RAY PHOTOELECTRON-SPECTROSCOPY (XPS) AND SECONDARY ION MASS-SPECTROSCOPY (SIMS)

被引：11

作者：

GETTINGS, M ^{[1
]}

COAD, JP ^{[1
]}

机构：

[1] ATOM ENERGY RES ESTAB, MAT DEV DIV, HARWELL, ENGLAND

来源：

SURFACE SCIENCE | 1975年 / 53卷 / DEC期

关键词：

D O I：

10.1016/0039-6028(75)90160-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

收藏

页码：636 / 648

页数：13

相关论文

共 21 条

[1] THERMODYNAMIC APPROACH TO QUANTITATIVE INTERPRETATION OF SPUTTERED ION MASS-SPECTRA
ANDERSEN, CA
HINTHORNE, JR
[J]. ANALYTICAL CHEMISTRY, 1973, 45 (08) : 1421 - 1438
[2] SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS)
BENNINGHOVEN, A
[J]. SURFACE SCIENCE, 1973, 35 (01) : 427 - 457
[3] UNTERSUCHUNGEN ZUR EMISSION POSITIVER SEKUNDARIONEN AUS FESTEN TARGETS . DIE BRAUCHBARKEIT DER IONENBESCHUSS-IONENQUELLE IN DER MASSENSPEKTROSKOPIE
BESKE, HE
[J]. ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1967, A 22 (04): : 459 - +
[4] EXPERIMENTAL EVALUATION OF A SIMPLE MODEL FOR QUANTITATIVE-ANALYSIS IN X-RAY PHOTOELECTRON-SPECTROSCOPY
CARTER, WJ
SCHWEITZER, GK
CARLSON, TA
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 5 (NOV-D) : 827 - 835
[5] QUANTITATIVE-ANALYSIS OF BINARY-ALLOYS BY XPS
EBEL, MF
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 5 (NOV-D) : 837 - 846
[6] JORGENSEN CK, 1972, T FARADAY DISCUSSION, P269
[7] JORGENSEN CK, 1971, MODERN ASPECTS LIGAN, pCH38
[8] JOSHI A, 1973, J TEST EVAL, V1, P202, DOI 10.1520/JTE10004J
[9] Nefedov V. I., 1973, Journal of Electron Spectroscopy and Related Phenomena, V2, P383, DOI 10.1016/0368-2048(73)80055-6
[10] NORDLING C, 1972, ANGEW CHEM, V84, P144