SCANNING PHOTOEMISSION MICROSCOPY ON MAXIMUM REACHES 0.1 MICRON RESOLUTION

被引:17
作者
CAPASSO, C
NG, W
RAYCHAUDHURI, AK
LIANG, SH
COLE, RK
GUO, ZY
WALLACE, J
CERRINA, F
UNDERWOOD, J
PERERA, R
KORTRIGHT, J
DE STASIO, G
MARGARITONDO, G
机构
[1] LAWRENCE BERKELEY LAB, BERKELEY, CA 94720 USA
[2] CNR, IST STRUTTURA MAT, FRASCATI, ITALY
[3] ECOLE POLYTECH FED LAUSANNE, INST PHYS APPL, CH-1015 LAUSANNE, SWITZERLAND
基金
美国国家科学基金会;
关键词
D O I
10.1016/0039-6028(93)91124-8
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We present the first results from the upgraded version of the scanning photoemission spectromicroscope MAXIMUM, bared on synchrotron undulator fight and on a multilayer-coated Schwarzschild objective. The upgrade involved nearly all parts of the instrument, notably the beamline and the electron analysis system. Micro-images of Fresnel zone plates and of metal test patterns on semiconductor substrates reached a new record in lateral resolution, well beyond 0.1 micron. The first spectromicroscopy tests were also successfully performed on the new instrument, with analysis of f and d core levels in different systems.
引用
收藏
页码:1046 / 1050
页数:5
相关论文
共 28 条
  • [1] INTRACELLULAR STRUCTURE AND ELEMENTAL ANALYSIS IN RAPID-FROZEN NEURONS
    ANDREWS, SB
    REESE, TS
    [J]. ANNALS OF THE NEW YORK ACADEMY OF SCIENCES, 1986, 483 : 284 - 294
  • [2] HIGH-RESOLUTION X-RAY MICROSCOPY USING AN UNDULATOR SOURCE, PHOTOELECTRON STUDIES WITH MAXIMUM
    CAPASSO, C
    RAYCHAUDHURI, AK
    NG, W
    LIANG, S
    COLE, RK
    WALLACE, J
    CERRINA, F
    MARGARITONDO, G
    UNDERWOOD, JH
    KORTRIGHT, JB
    PERERA, RCC
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (03): : 1248 - 1253
  • [3] MAXIMUM - STATUS OF THE SCANNING PHOTOELECTRON MICROSCOPE
    CERRINA, F
    LAI, B
    GONG, C
    RAYCHAUDHURI, A
    MARGARITONDO, G
    GREEN, MA
    HOCHST, H
    COLE, R
    CROSSLEY, D
    COLLIER, S
    UNDERWOOD, J
    BRILLSON, LJ
    FRANCIOSI, A
    DELUCA, PM
    GOULD, MN
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1989, 60 (07) : 2249 - 2249
  • [4] CERRINA F, 1990, J VAC SCI TECHNOL A, V8, P2563
  • [6] SCANNING PHOTOELECTRON MICROSCOPY WITH UNDULATOR RADIATION - A SUCCESSFUL TEST ON UNCOATED NEURONS
    DE STASIO, G
    NG, W
    RAYCHAUDHURI, AK
    COLE, RK
    GUO, ZY
    WALLACE, J
    MARGARITONDO, G
    CERRINA, F
    UNDERWOOD, J
    PERERA, R
    KORTRIGHT, J
    MERCANTI, D
    CIOTTI, MT
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1990, 294 (1-2) : 351 - 354
  • [7] HIGH-RESOLUTION PHOTOELECTRON MICROIMAGING OF NEURON NETWORKS
    DE STASIO, G
    CAPASSO, C
    NG, W
    RAYCHAUDHURI, AK
    LIANG, SH
    COLE, RK
    GUO, ZY
    WALLACE, J
    CERRINA, F
    MARGARITONDO, G
    UNDERWOOD, J
    PERERA, R
    KORTRIGHT, J
    MERCANTI, D
    CIOTTI, MT
    STECCHI, A
    [J]. EUROPHYSICS LETTERS, 1991, 16 (04): : 411 - 414
  • [8] DESTASIO G, UNPUB
  • [9] A PERMANENT-MAGNET UNDULATOR FOR SPEAR
    HALBACH, K
    CHIN, J
    HOYER, E
    WINICK, H
    CRONIN, R
    YANG, J
    ZAMBRE, Y
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1981, 28 (03) : 3136 - 3138
  • [10] X-RAY ABSORPTION NEAR EDGE STRUCTURES OF INTERMEDIATE OXIDATION-STATES OF SILICON IN SILICON-OXIDES DURING THERMAL-DESORPTION
    HARP, GR
    HAN, ZL
    TONNER, BP
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (03): : 2566 - 2569