X-RAY MIRROR SURFACES EVALUATED BY AN X-RAY TOPOGRAPHICAL TECHNIQUE

被引：16

作者：

MANCINI, DC

BILDERBACK, DH

机构：

[1] CORNELL UNIV,CORNELL HIGH ENERGY SYNCHROTRON SOURCE,ITHACA,NY 14853

[2] CORNELL UNIV,SCH APPL & ENGN PHYS,ITHACA,NY 14853

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 208卷 / 1-3期

关键词：

D O I：

10.1016/0167-5087(83)91133-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：263 / 272

页数：10

相关论文

共 7 条

[1] PROPOSED USE OF VISIBLE OPTICAL TECHNIQUES TO EVALUATE THE SURFACE FINISH OF X-RAY OPTICS
BENNETT, HE
[J]. OPTICAL ENGINEERING, 1980, 19 (04) : 610 - 615
[2] BILDERBACK DH, 1981, P SOC PHOTO-OPT INST, V315, P90
[3] X-RAY OPTICS - IMPERFECTIONS OF OPTICAL FLATS AND THEIR EFFECT ON THE REFLECTION OF X-RAYS
EHRENBERG, W
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1949, 39 (09) : 746 - 751
[4] FRANKS A, 1981, AIP C P, V75, P179
[5] HALLIDAY D, 1970, FUNDAMENTALS PHYSICS
[6] PRODUCTION AND ASSESSMENT OF SUPERSMOOTH OPTICAL SURFACES
LINDSEY, K
PENFOLD, AB
[J]. OPTICAL ENGINEERING, 1976, 15 (03) : 220 - 225
[7] LINDSEY K, 1974, PRODUCTION TOPOGRAPH