HIGH-RESOLUTION MAGNETIC MICROSTRUCTURE IMAGING USING SECONDARY-ELECTRON SPIN POLARIZATION ANALYSIS IN A SCANNING ELECTRON-MICROSCOPE

被引：31

作者：

UNGURIS, J

HEMBREE, GG

CELOTTA, RJ

PIERCE, DT

机构：

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1985年 / 139卷 / AUG期

关键词：

D O I：

10.1111/j.1365-2818.1985.tb02628.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

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页码：RP1 / RP2

页数：2

相关论文

共 6 条

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[2] DiStefano T. H., 1978, IBM Technical Disclosure Bulletin, V20, P4212
[3] KIRSCHNER J, 1984, SEM, P1178
[4] OBSERVATION OF MAGNETIC DOMAINS WITH SPIN-POLARIZED SECONDARY ELECTRONS
KOIKE, K
HAYAKAWA, K
[J]. APPLIED PHYSICS LETTERS, 1984, 45 (05) : 585 - 586
[5] DOMAIN OBSERVATION WITH SPIN-POLARIZED SECONDARY ELECTRONS
KOIKE, K
HAYAKAWA, K
[J]. JOURNAL OF APPLIED PHYSICS, 1985, 57 (08) : 4244 - 4248
[6] SPIN AND ENERGY ANALYZED SECONDARY-ELECTRON EMISSION FROM A FERROMAGNET
UNGURIS, J
PIERCE, DT
GALEJS, A
CELOTTA, RJ
[J]. PHYSICAL REVIEW LETTERS, 1982, 49 (01) : 72 - 76