DETERMINATION OF LOW ABSORPTION-COEFFICIENTS FROM ABSORPTANCE MEASUREMENTS ON THIN-FILMS

被引：22

作者：

DRISSKHODJA, K

GHEORGHIU, A

THEYE, ML

机构：

[1] CNRS, Lab d'Optique des Solides,, Paris, Fr, CNRS, Lab d'Optique des Solides, Paris, Fr

来源：

OPTICS COMMUNICATIONS | 1985年 / 55卷 / 03期

关键词：

SEMICONDUCTOR MATERIALS - Thin Films;

D O I：

10.1016/0030-4018(85)90040-9

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We discuss the determination of the absorption coefficient ( alpha ) from absorptance (A) measurements on thin films in the low absorption range, especially in the case of amorphous semiconductor films studied by photothermal spectroscopies. We propose approximate expressions between A and alpha , determine their range of validity and compare them to expressions used by other authors.

引用

页码：169 / 173

页数：5

共 15 条

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