CHARACTERIZATION OF ORGANIC OVERLAYERS ON WELL-DEFINED SUBSTRATES

被引：33

作者：

UMBACH, E

机构：

[1] Physikalisches Institut, Universität Stuttgart

来源：

PROGRESS IN SURFACE SCIENCE | 1990年 / 35卷 / 1-4期

关键词：

D O I：

10.1016/0079-6816(90)90030-N

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Proceeding from some remarks on the importance of organic/inorganic interfaces and of the controlled growth of thin organic films for both, basic research and present or future applications it is shown that surface sensitive methods like NEXAFS, XPS, ARUPS, and TPD can nicely be applied for studying various model systems. These systems range from perylene single crystals, over perylene and PTCDA layers on Si(111), PTCDA on Ag(111), HCOOH on Ni(111) to adsorption and polymerization of thiophene on a Ag(111) surface. Selected data are shown, and some results are briefly discussed.

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页码：113 / 127

页数：15

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