CROSS-SECTIONAL HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPE STUDIES OF SUPERCONDUCTING OXIDE THIN-FILMS OF THE BI-SYSTEM

被引：6

作者：

IKEDA, S ^{[1
]}

SATO, J ^{[1
]}

NAKAMURA, K ^{[1
]}

机构：

[1] HITACHI CABLE LTD,HITACHI,IBARAKI 317,JAPAN

来源：

MATERIALS TRANSACTIONS JIM | 1990年 / 31卷 / 07期

关键词：

bismuth-strontium-calcium-copper-oxygen; cross-sectional observation; epitaxial growth; high-resolution electron microscopy; oxide superconductor; thin film;

D O I：

10.2320/matertrans1989.31.602

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Structures of artificial Bi-O/ Sr-Ca-Cu-O multilayered films with a designed period of c=3.7 nm have been examined by a cross-sectional TEM method. The modulated structure similar to bulk BSCCO can be seen in both samples cooled in oxygen, which are superconductors of Tc(zero)= 10-30 K, and samples cooled in vacuum, which are not superconductors. In the films, Bi atoms frequently shift from the standard position of bulk BSCCO. In the most of the grains a and b axes of the films are parallel to <100> of the MgO substrate. The epitaxial growth is discussed considering that both Bi-O layers and MgO have the rock salt type structure. © 1990, The Japan Institute of Metals. All rights reserved.

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页码：602 / 607

页数：6

相关论文

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