DETERMINATION OF THE PHOTOEMISSION GENERATION DEPTH WITH USE OF EXPERIMENTS ON THE DYNAMIC SCATTERING OF X-RAYS

被引:3
作者
KRUGLOV, MV
SOLOMIN, IK
LUNEV, AV
机构
来源
PHYSICA STATUS SOLIDI B-BASIC RESEARCH | 1986年 / 133卷 / 01期
关键词
D O I
10.1002/pssb.2221330105
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
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页码:47 / 55
页数:9
相关论文
共 16 条
[1]  
BRONSTEIN IM, 1969, SECONDARY ELECTRON E, P88
[2]  
ELISEENKO LG, 1966, FIZ TVERD TELA, V8, P3649
[3]  
KRUGLOV MV, 1977, KRISTALLOGRAFIYA+, V22, P693
[4]  
KRUGLOV MV, 1983, FIZ TVERD TELA+, V25, P653
[5]   DETECTION OF ATOMIC PLANE DISPLACEMENTS IN NEAR-SURFACE LAYERS OF CRYSTALS USING ANGULAR-DEPENDENCE OF PHOTOEMISSION DURING BRAGG-DIFFRACTION OF X-RAYS [J].
KRUGLOV, MV ;
SHCHEMELEV, VN ;
KAREVA, GG .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1978, 46 (01) :343-350
[6]   ANALYSIS OF ELECTRON-TRANSPORT IN CONVERSION ELECTRON MOSSBAUER-SPECTROSCOPY (CEMS) [J].
LILJEQUIST, D ;
EKDAHL, T ;
BAVERSTAM, U .
NUCLEAR INSTRUMENTS & METHODS, 1978, 155 (03) :529-538
[7]  
LILJEQUIST D, 1979, ELECTRON PENETRATION
[8]   SIMPLE ANALYTICAL CALCULATION FOR X-RAY PHOTOEMISSION [J].
LOPEZ, O .
JOURNAL OF APPLIED PHYSICS, 1975, 46 (06) :2504-2508
[9]  
MUKHAMEDZHANOV EK, 1984, POVERKHNOST, V3, P54
[10]   SOFT X-RAY PHOTOELECTRIC YIELD FORMULAS [J].
OGIER, WT ;
ELLIS, DV .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (12) :3788-&