COMPUTER ENHANCEMENT OF SCANNING ELECTRON MICROGRAPHS

被引：17

作者：

LEWIS, BL ^{[1
]}

SAKRISON, DJ ^{[1
]}

机构：

[1] UNIV CALIF, ELECTR RES LAB, BERKELEY, CA 94720 USA

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS | 1975年 / CA22卷 / 03期

关键词：

D O I：

10.1109/TCS.1975.1084027

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：267 / 278

页数：12

共 21 条

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[6] SCANNING ELECTRON-MICROSCOPE [J].

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[7]

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[8] IMAGE PROCESSING [J].

HUANG, TS ;

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[10]

LEWIS BL, 1973, THESIS U CALIFORNIA

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