X-RAY-DIFFRACTION STUDIES OF CATALYSTS

被引：25

作者：

COHEN, JB

机构：

[1] Department of Materials Science and Engineering, The Robert R. McCormick School of Engineering and Applied Science, The Technological Institute, Evanston

来源：

ULTRAMICROSCOPY | 1990年 / 34卷 / 1-2期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0304-3991(90)90055-Q

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

With the new high-intensity X-ray sources, by using anomalous scattering and glancing incidence, it is now possible to obtain considerable statistical information on catalysts-supported metals (size distribution and perfection), micron-sized single-crystal particles (structure), and the nature of surfaces. Examples of work on catalyst materials is given to illustrate these possibilities. © 1990.

引用

页码：41 / 46

页数：6

共 20 条

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