SYNCHROTRON X-RAY TOPOGRAPHY STUDIES OF TWIN STRUCTURES IN LANTHANUM ALUMINATE SINGLE-CRYSTALS

被引：26

作者：

YAO, GD ^{[1
]}

HOU, SY ^{[1
]}

DUDLEY, M ^{[1
]}

PHILLIPS, JM ^{[1
]}

机构：

[1] AT&T BELL LABS,MURRAY HILL,NJ 07974

来源：

JOURNAL OF MATERIALS RESEARCH | 1992年 / 7卷 / 07期

基金：

美国能源部;

关键词：

D O I：

10.1557/JMR.1992.1847

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

An extensive investigation of twin structures in lanthanum aluminate single crystals at room temperature has been undertaken using White Beam Synchrotron X-Ray Topography (WBSXRT). Twin configurations, directly observable via orientation contrast, were found to comprise both large-volume, macroscopic twins and thick twin lamellae. Positional shifts of twin domain images with respect to matrix images, arising from the mutual misorientation of diffraction vectors, were measured on x-ray topographic images recorded from the (220)rhom planes approximately parallel to the specimen surface and compared to calculated values in order to solve the twin laws in this system. The dominant twin operations were found to be (101)rhom, (011)rhom, and (112)rhom mirror reflections. The potential influence of the twins on the growth of epitaxial Ba2YCu3O7-delta thin films is discussed.

引用

页码：1847 / 1855

页数：9

共 16 条

[1] TRANSPORT CRITICAL CURRENT-DENSITY IN EPITAXIAL BI2SR2CACU2O8+X FILMS - EFFECTS OF THE SUBSTRATE TWINNING [J].