X-RAY-EMISSION SPECTROSCOPY STUDY OF SUBSTOICHIOMETRIC BI2-XSBXS3 SYSTEM

被引：7

作者：

NAYAK, BB

ACHARYA, BS

SINGH, SK

机构：

来源：

THIN SOLID FILMS | 1988年 / 164卷

关键词：

D O I：

10.1016/0040-6090(88)90112-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：75 / 80

页数：6

共 18 条

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[7] STRUCTURAL CHARACTERIZATION OF BI2-XSBXS3 FILMS PREPARED BY THE DIP-DRY METHOD [J].

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