DEHAAS-VANALPHEN SCATTERING MEASUREMENTS ON THE REENTRANT SUPERCONDUCTOR LA1-XCEXAL2

被引：1

作者：

EPSTEIN, SI

HIGGINS, RJ

LOWNDES, DH

STEGLICH, F

SMITH, JF

机构：

[1] TH DARMSTADT,INST FESTKORPERPHYS,D-6100 DARMSTADT,FED REP GER

[2] IOWA STATE UNIV SCI & TECHNOL,AMES LAB,AMES,IA 50011

来源：

PHYSICAL REVIEW B | 1985年 / 32卷 / 09期

关键词：

D O I：

10.1103/PhysRevB.32.5683

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：5683 / 5692

页数：10

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