OBSERVATION OF SPECKLE BY DIFFRACTION WITH COHERENT X-RAYS

被引:316
作者
SUTTON, M
MOCHRIE, SGJ
GREYTAK, T
NAGLER, SE
BERMAN, LE
HELD, GA
STEPHENSON, GB
机构
[1] MIT,DEPT PHYS,CAMBRIDGE,MA 02139
[2] UNIV FLORIDA,DEPT PHYS,GAINESVILLE,FL 32611
[3] BROOKHAVEN NATL LAB,NATL SYNCHROTRON LIGHT SOURCE,UPTON,NY 11973
[4] IBM CORP,THOMAS J WATSON RES CTR,DIV RES,YORKTOWN HTS,NY 10598
关键词
D O I
10.1038/352608a0
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
REFLECTED light from a coherent light source such as a laser shows a graininess known as speckle. In general, a speckle pattern is produced whenever randomly distributed regions of a material introduce different phase shifts into the scattering of coherent incident light. If the arrangement of the regions evolves with time, the speckle pattern will also change. Observation of the intensity fluctuations at a single point in the speckle pattern provides a direct measure of the time correlation function of the inhomogeneity. This leads to a technique 1,2, alternatively called light-beating spectroscopy, dynamic light scattering or intensity fluctuation spectroscopy, which has been widely used with visible light to study processes such as critical fluctuations near phase transitions in fluids and the diffusion of particles in liquids. But it is not possible to study processes involving length scales less than about 200 nm, or those in opaque materials, using visible light. If intensity fluctuation spectroscopy could be carried out using coherent X-rays, however, one could probe the dynamics of processes involving atomic length scales in a wide range of materials. Here we show that by using a high-brilliance X-ray source it should be possible to perform this type of measurement using radiation of wavelength approximately 0.15 nm. Specifically, we have observed a speckle pattern in the diffraction of coherent X-rays from randomly arranged antiphase domains in a single crystal of the binary alloy Cu3Au.
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页码:608 / 610
页数:3
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