MICROWAVE PHOTOCONDUCTIVITY LIFETIME MEASUREMENTS - EXPERIMENTAL LIMITATIONS

被引：12

作者：

DERI, RJ

SPOONHOWER, JP

机构：

来源：

关键词：

D O I：

10.1063/1.1137937

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1343 / 1347

页数：5

共 16 条

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SPOONHOWER, JP .

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DERI, RJ ;

HAYNAM, C ;

SPOONHOWER, JP .

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[7]

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[8]

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[9]

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[10]

JACKSON JD, 1975, CLASSICAL ELECTRODYN, P236