MAGNETIC-PROPERTIES OF MULTILAYERS FROM SOFT-X-RAY MAGNETIC CIRCULAR-DICHROISM

被引:3
作者
CHEN, CT
IDZERDA, YU
KAO, CC
TJENG, LH
LIN, HJ
MEIGS, G
机构
[1] USN,RES LAB,WASHINGTON,DC 20375
[2] BROOKHAVEN NATL LAB,NATL SYNCHROTRON LIGHT SOURCE DEPT,UPTON,NY 11973
来源
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1995年 / 31卷 / 1-2期
关键词
MAGNETIC MEASUREMENTS; X-RAY SPECTROSCOPY; FILM DEPOSITION;
D O I
10.1016/0921-5107(94)08018-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Soft X-ray magnetic circular dichroism (MCD) is the difference between the absorptivity or reflectivity of left and right circularly polarized soft X-rays at the magnetically interesting L(2,3) edges of 3d transition metals or the M(4,5) edges of the 4f rare earth elements. Thanks to its large absorption cross-section and strong MCD effect, this technique has become a powerful new means for probing, in an element- and site-specific manner, the magnetic properties of ultra-thin films and multilayers. Soft X-ray MCD experiments, recently conducted at the Dragon beamline, are utilized to demonstrate the key applications of this technique in magnetic thin film research.
引用
收藏
页码:49 / 56
页数:8
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