DIELECTRIC BEHAVIOR IN NI-AL FERRITES AT LOW-FREQUENCIES

被引：38

作者：

AHMED, MA

ELNIMR, MK

TAWFIK, A

ELHASAB, AM

机构：

[1] Department of Physics, Faculty of Science, Tanta University, Tanta

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1991年 / 98卷 / 1-2期

关键词：

D O I：

10.1016/0304-8853(91)90422-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The dielectric constant (epsilon-r) and the dielectric loss (tan-delta) have been measured for samples of the type NiAl(x)Fe2-xO4 (x = 0, 0.2, 0.4, 0.6, 0.8 and 1). The measurements were carried out in the frequency range from 100 up to 10(5) Hz. The dielectric behaviour is found to be abnormal, giving a relaxation peak at a certain frequency. The peak shifts to lower frequency due to increasing aluminium substitution. The abnormal behaviour of the dielectric is explained due to two types of charge carriers. The temperature dependence of the dielectric relaxation frequency is measured and the activation energy of the dielectric relaxation is calculated.

引用

页码：33 / 36

页数：4

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