A COMPARISON OF DOMAIN IMAGES OBTAINED FOR NANOPHASE ALLOYS BY MAGNETIC FORCE MICROSCOPY AND HIGH-RESOLUTION LORENTZ ELECTRON-MICROSCOPY

被引：20

作者：

GIBBS, MRJ

ALKHAFAJI, MA

RAINFORTH, WM

DAVIES, HA

BABCOCK, K

CHAPMAN, JN

HEYDERMAN, LJ

机构：

[1] DIGITAL INSTRUMENTS INC,SANTA BARBARA,CA

[2] UNIV GLASGOW,DEPT PHYS & ASTRON,GLASGOW G12 8QQ,LANARK,SCOTLAND

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1995年 / 31卷 / 06期

基金：

英国工程与自然科学研究理事会;

关键词：

D O I：

10.1109/20.490378

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The study of domain images in advanced magnetic materials is central to their further development and exploitation. For nanophase exchange- coupled magnetic materials, high spatial resolution is required for both topographic and magnetic imaging. In this paper we make a direct comparison of magnetic force microscopy and Lorentz microscopy, in order to establish the degree of complimentarity and agreement between the two techniques. Examples will be drawn from both hard (Nd-Fe-B) and soft (Fe-based) nanophase magnetic materials.

引用

页码：3349 / 3351

页数：3

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