ELECTRON-MICROSCOPY OF CUPROUS-OXIDE ISLAND GROWTH

[1] DIFFRACTION CONTRAST FROM SPHERICALLY SYMMETRICAL COHERENCY STRAINS [J]. PHILOSOPHICAL MAGAZINE, 1963, 8 (91): : 1083 - &

[2] INSITU STUDY OF TITANIUM OXIDATION BY HIGH-VOLTAGE ELECTRON-MICROSCOPY [J]. ACTA METALLURGICA, 1974, 22 (11): : 1339 - 1347

[3] Gronlund F., 1956, J CHIM PHYS PCB, V53, DOI 10.1051/jcp/1956530660

[4] THE STRUCTURE OF OXIDE FILMS FORMED ON SMOOTH FACES OF A SINGLE CRYSTAL OF COPPER [J]. ACTA METALLURGICA, 1957, 5 (10): : 574 - 581

[5] HART RK, 1970, SURFACE SCI, V20, P385

[6] HIRSH PB, 1965, ELECTRON MICROS, P201

[7] ELECTRON MICROSCOPIC OBSERVATION OF OXIDES FORMED ON THIN FILM OF COPPER AT ELEVATED TEMPERATURE [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1967, 6 (02) : 173 - +

[8] JARDINIE.M, 1974, MEM ETUD SCI REV MET, V71, P401

[9] JARDINIE.M, 1974, MEM ETUD SCI REV MET, V71, P389

[10] LAWLESS KR, 1965, MEM ETUD SCI REV MET, V62, P27

[1] DIFFRACTION CONTRAST FROM SPHERICALLY SYMMETRICAL COHERENCY STRAINS [J]. PHILOSOPHICAL MAGAZINE, 1963, 8 (91): : 1083 - &

[2] INSITU STUDY OF TITANIUM OXIDATION BY HIGH-VOLTAGE ELECTRON-MICROSCOPY [J]. ACTA METALLURGICA, 1974, 22 (11): : 1339 - 1347

[3] Gronlund F., 1956, J CHIM PHYS PCB, V53, DOI 10.1051/jcp/1956530660

[4] THE STRUCTURE OF OXIDE FILMS FORMED ON SMOOTH FACES OF A SINGLE CRYSTAL OF COPPER [J]. ACTA METALLURGICA, 1957, 5 (10): : 574 - 581

[5] HART RK, 1970, SURFACE SCI, V20, P385

[6] HIRSH PB, 1965, ELECTRON MICROS, P201

[7] ELECTRON MICROSCOPIC OBSERVATION OF OXIDES FORMED ON THIN FILM OF COPPER AT ELEVATED TEMPERATURE [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1967, 6 (02) : 173 - +

[8] JARDINIE.M, 1974, MEM ETUD SCI REV MET, V71, P401

[9] JARDINIE.M, 1974, MEM ETUD SCI REV MET, V71, P389

[10] LAWLESS KR, 1965, MEM ETUD SCI REV MET, V62, P27