CHARACTERIZATION OF THIN-FILMS OF AMORPHOUS CUXZR1-X USING OPTICAL AND ELECTRON-SPECTROSCOPY

被引：2

作者：

RIVORY, J

FRIGERIO, JM

NEVOT, L

DUC, TM

机构：

[1] UNIV LYON 1,DEPT PHYS MAT,F-69622 VILLEURBANNE,FRANCE

[2] INST NATL PHYS NUCL & PHYS PARTICULES,F-69622 VILLEURBANNE,FRANCE

[3] UNIV PARIS 11,INST OPT,SERV 12,F-91405 ORSAY,FRANCE

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1984年 / 61-2卷 / JAN期

关键词：

D O I：

10.1016/0022-3093(84)90695-1

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：1143 / 1148

页数：6

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