共 13 条
[1]
BASTERFIELD J, 1968, J MATER SCI, V3, P33
[3]
BIREFRINGENCE CAUSED BY EDGE DISLOCATIONS IN SILICON
[J].
PHYSICAL REVIEW,
1958, 110 (03)
:620-623
[7]
INDENBOM VL, 1957, SOV PHYS-CRYSTALLOGR, V2, P183
[8]
Lang A. R., 1970, Modern diffraction and imaging techniques in material science, P407
[9]
MATHEWS JW, 1973, ACTA METALL, V21, P203