DETERMINATION OF ATOMIC DISPLACEMENT MODULATION IN MULTI-LAYER STRUCTURE BY X-RAY-DIFFRACTION

被引:7
作者
HARADA, J [1 ]
KASHIHARA, Y [1 ]
SAKATA, M [1 ]
MASHITA, M [1 ]
ASHIZAWA, Y [1 ]
机构
[1] TOSHIBA CORP,CTR RES & DEV,SAIWAI KU,KAWASAKI 210,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1985年 / 24卷 / 01期
关键词
D O I
10.1143/JJAP.24.L62
中图分类号
O59 [应用物理学];
学科分类号
摘要
5
引用
收藏
页码:L62 / L64
页数:3
相关论文
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[2]  
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[3]  
FURUTA T, 1977, JPN J APPL PHYS, V10, P1
[4]   X-RAY EVIDENCE FOR A TERRACED GAAS ALAS SUPER-LATTICE [J].
NEUMANN, DA ;
ZABEL, H ;
MORKOC, H .
APPLIED PHYSICS LETTERS, 1983, 43 (01) :59-61
[5]   X-RAY-DIFFRACTION STUDY OF A ONE-DIMENSIONAL GAAS-ALAS SUPERLATTICE [J].
SEGMULLER, A ;
KRISHNA, P ;
ESAKI, L .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1977, 10 (FEB1) :1-6