EXPERIMENTAL REQUIREMENTS FOR ACCURATE X-RAY INTENSITY MEASUREMENTS BY PHOTOGRAPIC MEANS

被引：8

作者：

JEFFERY, JW

WHITAKER, A

机构：

来源：

ACTA CRYSTALLOGRAPHICA | 1965年 / 19卷

关键词：

D O I：

10.1107/S0365110X65004723

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：963 / &

共 17 条

[1] MAKING SMALL SPHERES
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[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1951, 22 (05) : 344 - 345
[2] THE REQUIRED PRECISION OF INTENSITY MEASUREMENTS FOR SINGLE-CRYSTAL ANALYSIS
CRUICKSHANK, DWJ
[J]. ACTA CRYSTALLOGRAPHICA, 1960, 13 (10): : 774 - 777
[3] STRUCTURE OF A SILICON CARBIDE POLYTYPE 24R
HAMILTON, WC
ROLLETT, JS
SPARKS, RA
[J]. ACTA CRYSTALLOGRAPHICA, 1965, 18 : 129 - &
[4] HENRY NFM, 1960, INTERPRETATION XRAY, P112
[5] A SIMPLE PHOTOMETER FOR MEASURING OPTICAL DENSITY OF INTEGRATING WEISSENBERG REFLECTIONS
JEFFERY, JW
[J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1963, 40 (10): : 494 - &
[6] ABSORPTION + OTHER ERRORS IN MEASUREMENT OF INTENSITIES OF X-RAY REFLEXIONS FROM SINGLE CRYSTALS
JEFFERY, JW
ROSE, KM
[J]. ACTA CRYSTALLOGRAPHICA, 1964, 17 (04): : 343 - &
[7] MACGILLAVRY CH, 1964, PRIVATE COMMUNICATIO
[8] MAMMI M, 1963, ACTA CRYSTALLOGR, V16, pA149
[9] A SECOND COMPARISON OF VARIOUS COMMERCIALLY AVAILABLE X-RAY FILMS
MORIMOTO, H
UYEDA, R
[J]. ACTA CRYSTALLOGRAPHICA, 1963, 16 (11): : 1107 - &
[10] METHOD FOR CUTTING AND SHAPING FRAGILE CRYSTALS
PEPINSKY, R
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1953, 24 (05) : 403 - 403