THE EFFECTS OF IMPURITIES ON THE MICROTOPOGRAPHY OF LEAD PHTHALOCYANINE THIN-FILMS

被引：21

作者：

COLLINS, RA

STRICKLAND, KR

JEFFERY, MJ

DAVIDSON, K

JONES, TA

机构：

[1] UNIV LANCASTER,DEPT CHEM,LANCASTER LA1 4YA,ENGLAND

[2] HLTH & SAFETY EXECUT,SHEFFIELD S3 7HQ,ENGLAND

来源：

MATERIALS LETTERS | 1990年 / 10卷 / 4-5期

关键词：

D O I：

10.1016/0167-577X(90)90083-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The structure of thermally evaporated lead phthalocyanine films prepared from commercial grade material was found to differ markedly from films fabricated from PbPc prepared in-house even after purification of the former by entrainer sublimation. The possibility that these properties may be due to the demetallation of the commercial grade PbPc during treatment with sulphuric acid, as suggested in early work on this material, was eliminated on the basis of a variety of experimental evidence. The differences in film structure appear to be the result of the different impurity contents of the two sources of PbPc. The dependence of film structure on impurities is of consequence in the fabrication of PbPc based thin film gas sensors.

引用

页码：170 / 174

页数：5

共 21 条

[1] KINETIC FACTORS IN THE RESPONSE OF ORGANOMETALLIC SEMICONDUCTOR GAS SENSORS [J].