DEFECT SIZING BY TRANSIENT THERMOGRAPHY .1. AN ANALYTICAL TREATMENT

被引:117
作者
ALMOND, DP
LAU, SK
机构
[1] School of Materials Science, University of Bath, St Patrick’s College, Bath, BA2 7AY, Claverton Down
关键词
D O I
10.1088/0022-3727/27/5/027
中图分类号
O59 [应用物理学];
学科分类号
摘要
Thermal edge effects for crack-like defects have been calculated using the Wiener-Hopf technique. It is found that the crack surface temperature is reduced over a distance of a thermal diffusion length by heat flow around the crack edge to the cold underside of the crack. Surface thermal images have been computed for a straight-edged and a circular crack. Comparisons are presented of image profiles computed with and without inclusion of edge effects. Edge effects lead to the prediction that transient thermographic defect images should shrink with elapsed time. Experimental data are presented, which are in agreement with this prediction and demonstrate a simple means of defect sizing.
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页码:1063 / 1069
页数:7
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