ULTRATHIN FILMS IN WETTING EVIDENCED BY X-RAY REFLECTIVITY

被引:81
作者
DAILLANT, J [1 ]
BENATTAR, JJ [1 ]
LEGER, L [1 ]
机构
[1] COLL FRANCE, F-75231 PARIS 05, FRANCE
来源
PHYSICAL REVIEW A | 1990年 / 41卷 / 04期
关键词
D O I
10.1103/PhysRevA.41.1963
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The role of thin films in different situations of wetting has been investigated by x-ray reflectivity, a technique that allows an independent determination of their thicknesses, densities, and roughnesses, using a nonvolatile siloxane oil spreading on different kinds of surfaces. The spreading of a microscopic droplet involves at least two stages: the development of a tongue of molecular thickness controlled by the spreading parameter and the friction on the substrate is followed by a surface diffusion process. The final stages of spreading are shown to be largely dependent on the polymer-substrate interactions. Increasing the chain length of the polymer slows the process down, but does not lead to a qualitatively different behavior. This study has been complemented with capillary rise experiments in order to measure diffusion constants. The results are discussed using a simple model of surface flow. © 1990 The American Physical Society.
引用
收藏
页码:1963 / 1977
页数:15
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