OPEN AND SHORT-CIRCUIT RELIABILITY OF SYSTEMS OF IDENTICAL ITEMS

被引：24

作者：

JENNEY, BW ^{[1
]}

SHERWIN, DJ ^{[1
]}

机构：

[1] UNIV BIRMINGHAM,DEPT ENGN PROD,BIRMINGHAM B15 2TT,W MIDLANDS,ENGLAND

来源：

关键词：

D O I：

10.1109/TR.1986.4335539

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：532 / 538

页数：7

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