HREM CHARACTERIZATION OF INTERFACES IN THIN MOCVD SUPERCONDUCTING FILMS

被引：2

作者：

DORIGNAC, D

SCHAMM, S

GRIGIS, C

SANTISO, J

GARCIA, G

FIGUERAS, A

机构：

[1] CSIC, ICMAB, E-08193 BARCELONA, SPAIN

[2] SE CARBUROS METALICOS, E-08038 BARCELONA, SPAIN

来源：

JOURNAL DE PHYSIQUE IV | 1995年 / 5卷 / C5期

关键词：

D O I：

10.1051/jphyscol:19955110

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

This paper is concerned with high-T-c superconducting compounds produced by metal-organic chemical vapour deposition. The nanostructure of different types of interfaces yttria stabilized zirconia buffer/(1-102)-sapphire substrate, YBa2Cu3O7-x film/Y2O3 precipitates as well as YBa2Cu3O7-x film/(001)-NdGaO3, SrTiO3, and -MgO substrates - has been investigated by high resolution electron microscopy. The orientation relationships and the corresponding layer sequences across the interfaces have been determined with the aid of computer simulations.

引用

页码：927 / 934

页数：8