PHOTOELECTRON PEAK INTENSITIES AND ATOM-ION OVERLAPS - ANALYSIS OF VARIOUS APPROXIMATIONS

被引：17

作者：

MEHTA, M

FADLEY, CS

BAGUS, PS

机构：

[1] UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822

[2] IBM CORP,RES LAB,SAN JOSE,CA 95114

来源：

CHEMICAL PHYSICS LETTERS | 1976年 / 37卷 / 03期

关键词：

D O I：

10.1016/0009-2614(76)85012-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

收藏

页码：454 / 459

页数：6

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