DOUBLE-CRYSTAL X-RAY-DIFFRACTION FROM SI1-XGEX/SI SUPERLATTICES - QUANTIFICATION OF PEAK BROADENING EFFECTS

被引：26

作者：

BARNETT, SJ ^{[1
]}

BROWN, GT ^{[1
]}

HOUGHTON, DC ^{[1
]}

BARIBEAU, JM ^{[1
]}

机构：

[1] NATL RES COUNCIL CANADA,OTTAWA K1A 0R6,ONTARIO,CANADA

来源：

APPLIED PHYSICS LETTERS | 1989年 / 54卷 / 18期

关键词：

D O I：

10.1063/1.101293

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1781 / 1783

页数：3

共 12 条

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