NON-VACUUM RUTHERFORD BACKSCATTERING SPECTROMETRY

[1] ANALYSIS OF BORON PRE-DEPOSITED SILICON WAFERS BY COMBINED ION-BEAM TECHNIQUES AND X-RAY MICROANALYSIS [J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 653 - 658

[2] SPATIAL INTENSITY PROFILE CHARACTERIZATION FOR AN EXTERNAL BEAM FROM A PROTON MICRO-PROBE [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 197 (01): : 121 - 128

[3] CHEN HS, 1981, NUCL INSTRUM METHODS, V191, P391

[4] Chu WK., 1978, BACKSCATTERING SPECT

[5] DOPING SURFACES WITH RADIOACTIVE ATOMS - FOR RESEARCH AND INDUSTRY [J]. CONTEMPORARY PHYSICS, 1982, 23 (04) : 353 - 369

[6] COOKSON JA, 1976, 4TH P C APPL SMALL A

[7] TRACE-ELEMENT ANALYSIS IN LIQUIDS BY PROTON-INDUCED X-RAY-EMISSION [J]. NUCLEAR INSTRUMENTS & METHODS, 1977, 142 (1-2): : 275 - 284

[8] DECONNINCK G, 1978, NUCL INSTR METH, V609

[9] DECONNINCK G, 1972, J RADIOANAL CHEM, V12, P162

[10] DECONNINCK G, 1981, AT ENERGY REV S, V2, P151

[1] ANALYSIS OF BORON PRE-DEPOSITED SILICON WAFERS BY COMBINED ION-BEAM TECHNIQUES AND X-RAY MICROANALYSIS [J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 653 - 658

[2] SPATIAL INTENSITY PROFILE CHARACTERIZATION FOR AN EXTERNAL BEAM FROM A PROTON MICRO-PROBE [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 197 (01): : 121 - 128

[3] CHEN HS, 1981, NUCL INSTRUM METHODS, V191, P391

[4] Chu WK., 1978, BACKSCATTERING SPECT

[5] DOPING SURFACES WITH RADIOACTIVE ATOMS - FOR RESEARCH AND INDUSTRY [J]. CONTEMPORARY PHYSICS, 1982, 23 (04) : 353 - 369

[6] COOKSON JA, 1976, 4TH P C APPL SMALL A

[7] TRACE-ELEMENT ANALYSIS IN LIQUIDS BY PROTON-INDUCED X-RAY-EMISSION [J]. NUCLEAR INSTRUMENTS & METHODS, 1977, 142 (1-2): : 275 - 284

[8] DECONNINCK G, 1978, NUCL INSTR METH, V609

[9] DECONNINCK G, 1972, J RADIOANAL CHEM, V12, P162

[10] DECONNINCK G, 1981, AT ENERGY REV S, V2, P151