INFORMATION AND DISTANCE MEASURES, ERROR BOUNDS, AND FEATURE SELECTION

[1] CHANDRASEKARAN B, 1974, 2ND P INT C PATT REC

[2] Chen C. H., 1973, STAT PATTERN RECOGNI

[3] CLASS OF COMPUTATIONALLY EFFICIENT FEATURE SELECTION CRITERIA [J]. PATTERN RECOGNITION, 1975, 7 (1-2) : 87 - 94

[4] Csiszar I., 1967, STUD SCI MATH HUNG, V2, P299

[5] CSISZAR I, UNPUBLISHED REPORT

[6] NEW CLASS OF BOUNDS ON BAYES RISK IN MULTIHYPOTHESIS PATTERN-RECOGNITION [J]. IEEE TRANSACTIONS ON COMPUTERS, 1974, C 23 (01) : 70 - 80

[7] DEVIJVER PA, 1974, R232 REP

[8] ITO T, 1972, MACH INTELL, V7, P369

[9] DIVERGENCE AND BHATTACHARYYA DISTANCE MEASURES IN SIGNAL SELECTION [J]. IEEE TRANSACTIONS ON COMMUNICATION TECHNOLOGY, 1967, CO15 (01): : 52 - &

[10] PATTERNS IN PATTERN-RECOGNITION - 1968-1974 [J]. IEEE TRANSACTIONS ON INFORMATION THEORY, 1974, 20 (06) : 697 - 722

[1] CHANDRASEKARAN B, 1974, 2ND P INT C PATT REC

[2] Chen C. H., 1973, STAT PATTERN RECOGNI

[3] CLASS OF COMPUTATIONALLY EFFICIENT FEATURE SELECTION CRITERIA [J]. PATTERN RECOGNITION, 1975, 7 (1-2) : 87 - 94

[4] Csiszar I., 1967, STUD SCI MATH HUNG, V2, P299

[5] CSISZAR I, UNPUBLISHED REPORT

[6] NEW CLASS OF BOUNDS ON BAYES RISK IN MULTIHYPOTHESIS PATTERN-RECOGNITION [J]. IEEE TRANSACTIONS ON COMPUTERS, 1974, C 23 (01) : 70 - 80

[7] DEVIJVER PA, 1974, R232 REP

[8] ITO T, 1972, MACH INTELL, V7, P369

[9] DIVERGENCE AND BHATTACHARYYA DISTANCE MEASURES IN SIGNAL SELECTION [J]. IEEE TRANSACTIONS ON COMMUNICATION TECHNOLOGY, 1967, CO15 (01): : 52 - &

[10] PATTERNS IN PATTERN-RECOGNITION - 1968-1974 [J]. IEEE TRANSACTIONS ON INFORMATION THEORY, 1974, 20 (06) : 697 - 722