ELECTROREFLECTION MEASUREMENTS ON SEMICONDUCTOR ELECTROLYTE INTERFACES TO DETERMINE THE VOLTAGE DISTRIBUTION

被引：31

作者：

SCHOLZ, GA ^{[1
]}

GERISCHER, H ^{[1
]}

机构：

[1] MAX PLANCK GESELL,FRITZ HABER INST,D-1000 BERLIN 33,FED REP GER

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1985年 / 132卷 / 07期

关键词：

D O I：

10.1149/1.2114181

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

ELECTRODES

引用

页码：1643 / 1648

页数：6

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