SIMULATION OF TEM IMAGES CONSIDERING PHONON AND ELECTRONIC EXCITATIONS

被引：44

作者：

DINGES, C

BERGER, A

ROSE, H

机构：

[1] Institut für Angewandte Physik, TH Darmstadt, Hochschulstrasse 6

来源：

ULTRAMICROSCOPY | 1995年 / 60卷 / 01期

关键词：

D O I：

10.1016/0304-3991(95)00041-X

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

An improved image simulation procedure has been developed which takes into account elastic, inelastic and phonon scattering. The program allows the simulation of energy-filtered and unfiltered images of arbitrary objects. As typical examples diffraction patterns of thick crystalline specimens including phonon scattering, total scattering cross sections and filtered inelastic images of a small biological specimen are calculated and discussed.

引用

页码：49 / 70

页数：22

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