TRANSMISSION ELECTRON MICROSCOPY OF FAST-NEUTRON-IRRADIATED SILICON

被引：8

作者：

HEMMENT, PLF

GUNNERSE.EM

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1966年 / 37卷 / 07期

关键词：

D O I：

10.1063/1.1782152

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2912 / &

共 12 条

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[6]

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[8] MEASUREMENT OF THE RANGE OF RECOIL ATOMS [J].

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