THE INELASTIC MEAN FREE PATHS OF AUGER ELECTRONS IN THIN-FILMS OF COPPER AND NICKEL

被引：14

作者：

BURKE, MA

SCHREURS, JJ

机构：

来源：

关键词：

D O I：

10.1002/sia.740040203

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：42 / 46

页数：5

共 13 条

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[8] AUGER SPECTRA AND LEED PATTERNS FROM VACUUM CLEAVED SILICON CRYSTALS WITH CALIBRATED DEPOSITS OF IRON
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[J]. SURFACE SCIENCE, 1971, 24 (02) : 451 - &
[9] SCHREURS JPG, UNPUB
[10] Seah M. P., 1979, Surface and Interface Analysis, V1, P2, DOI 10.1002/sia.740010103