CORRESPONDENCE - STIMULATED MIGRATION OF POINT DEFECTS DUE TO ELECTRON BOMBARDMENT IN ELECTRON MICROSCOPE + ITS POSSIBLE EFFECT ON THEIR CLUSTERING

被引：22

作者：

NELSON, RS

机构：

来源：

PHILOSOPHICAL MAGAZINE | 1964年 / 10卷 / 106期

关键词：

D O I：

10.1080/14786436408228490

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：723 / &

共 6 条

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[5] FOCUSED COLLISION SEQUENCES IN TUNGSTEN AND MOLYBDENUM [J].

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[6]

THOMPSON MW, 1961, P ROY SOC A, V259, P458