MEAN FREE-PATH AND EFFECTIVE DENSITY OF CONDUCTION ELECTRONS IN POLYCRYSTALLINE METAL-FILMS

被引：99

作者：

VANCEA, J

HOFFMANN, H

KASTNER, K

机构：

[1] Univ Regensburg, Inst fuer, Angewandte Physik, Regensburg, West, Ger, Univ Regensburg, Inst fuer Angewandte Physik, Regensburg, West Ger

来源：

THIN SOLID FILMS | 1984年 / 121卷 / 03期

关键词：

This work was supported by the Deutsche Forschungsgemeinschaft. The authors are very much indebted to Dr. W. Pamler who prepared the electronic equipment of the computer-controlled systems;

D O I：

10.1016/0040-6090(84)90302-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：201 / 216

页数：16

共 17 条

[1] BRANDLI G, 1965, HELV PHYS ACTA, V38, P801
[2] MACROSCOPIC SURFACE-ROUGHNESS AND THE RESISTIVITY OF THIN METAL-FILMS
ELSOM, KC
SAMBLES, JR
[J]. JOURNAL OF PHYSICS F-METAL PHYSICS, 1981, 11 (03): : 647 - 656
[3] The conductivity of thin metallic films according to the electron theory of metals
Fuchs, K
[J]. PROCEEDINGS OF THE CAMBRIDGE PHILOSOPHICAL SOCIETY, 1938, 34 : 100 - 108
[4] HOFFMANN H, 1981, THIN SOLID FILMS, V85, P147, DOI 10.1016/0040-6090(81)90627-1
[5] HOFFMANN H, 1983, 9TH P INT VAC C 5TH, P351
[6] HOFFMANN H, UNPUB
[7] HOFFMANN H, 1982, ADV SOLID STATE PHYS, V22, P225
[8] MINUIT - SYSTEM FOR FUNCTION MINIMIZATION AND ANALYSIS OF PARAMETER ERRORS AND CORRELATIONS
JAMES, F
ROOS, M
[J]. COMPUTER PHYSICS COMMUNICATIONS, 1975, 10 (06) : 343 - 367
[9] ELECTRICAL RESISTIVITY MODEL FOR POLYCRYSTALLINE FILMS - CASE OF SPECULAR REFLECTION AT EXTERNAL SURFACES
MAYADAS, AF
SHATZKES, M
JANAK, JF
[J]. APPLIED PHYSICS LETTERS, 1969, 14 (11) : 345 - &
[10] ELECTRICAL-RESISTIVITY MODEL FOR POLYCRYSTALLINE FILMS - CASE OF ARBITRARY REFLECTION AT EXTERNAL SURFACES
MAYADAS, AF
SHATZKES, M
[J]. PHYSICAL REVIEW B, 1970, 1 (04): : 1382 - &

← 1 2 →